Inspection machine for the physical, electrical, electronic and visual inspection of electronic components; inspection machine for the physical, electrical, electronic and visual inspection of semiconductor devices; Testing apparatus for electronic components, namely, machines for testing electronic components; testing apparatus for semiconductor devices

'apparatus':28,39 'compon':13,31,37 'devic':26,42 'electr':6,19 'electron':7,12,20,30,36 'inspect':1,10,14,23 'machin':2,15,33 'name':32 'physic':5,18 'semiconductor':25,41 'test':27,35,38 'visual':9,22

Machines for packaging electronic components; machines for packaging semiconductor devices

'compon':5 'devic':10 'electron':4 'machin':1,6 'packag':3,8 'semiconductor':9

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