U.S. federal trademark · Serial No. 76634106
SPICE Model Evaluator and Data Analyzer Software (SMEDA) for use in integrated circuit design testing in the field of semiconductors, MISmatch Analyzer Software (MISANA) for use in integrated circuit design testing in the field of semiconductors, Wafer Acceptance Test Plan Editor Software (WAT-DAP) for use in integrated circuit design testing in the field of semiconductors, and Wafer Acceptance Test Plan Editor Software (WAT-TPE) for use in integrated circuit design testing in the field of semiconductors, and software for use in integrated circuit design testing in the field of semiconductors
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.