COMPUTER SOFTWARE AND SCANNING, READING, AND MEASUREMENT MACHINES, NAMELY, PROCESS CONTROL SOFTWARE AND SCANNING, READING, AND MEASUREMENT MACHINES FOR USE BY DEVICE MANUFACTURERS IN THE SILICON SEMICONDUCTOR AND OPTOELECTRONIC INDUSTRIES FOR OVERLAY, CRITICAL DIMENSION AND SUBSTRATE METROLOGY, AND BY OPTOELECTRONIC DEVICE MANUFACTURERS FOR PROCESS CONTROL AND MEASUREMENT

'comput':1 'control':11,45 'critic':33 'devic':22,41 'dimens':34 'industri':30 'machin':8,18 'manufactur':23,42 'measur':7,17,47 'metrolog':37 'name':9 'optoelectron':29,40 'overlay':32 'process':10,44 'read':5,15 'scan':4,14 'semiconductor':27 'silicon':26 'softwar':2,12 'substrat':36 'use':20

RETAIL SERVICES, NAMELY, DIRECT SOLICITATION BY SALES AGENTS IN THE FIELD OF SEMICONDUCTOR AND OPTOELECTRONIC PROCESS CONTROL SYSTEMS

'agent':8 'control':17 'direct':4 'field':11 'name':3 'optoelectron':15 'process':16 'retail':1 'sale':7 'semiconductor':13 'servic':2 'solicit':5 'system':18

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