instruments, namely, automated semiconductor wafer test equipment, for testing and inspecting physical and electrical properties of semiconductors, computer hardware and software used for testing and inspecting physical and electrical properties of semiconductors, computer hardware and software for yield management in semiconductor manufacturing and testing

'autom':3 'comput':18,33 'electr':14,29 'equip':7 'hardwar':19,34 'inspect':11,26 'instrument':1 'manag':39 'manufactur':42 'name':2 'physic':12,27 'properti':15,30 'semiconductor':4,17,32,41 'softwar':21,36 'test':6,9,24,44 'use':22 'wafer':5 'yield':38

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