U.S. federal trademark · Serial No. 79350283 · Reg. No. 7333839
Semiconductor photomask optical inspection apparatus; semiconductor reticle optical inspection apparatus; semiconductor photomask pattern optical inspection apparatus; semiconductor photomask pattern measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for detection, measurement and cleaning of foreign matter and defects on semiconductor photomask pattern; semiconductor reticle pattern optical inspection apparatus; semiconductor reticle pattern measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for detection, measurement and cleaning of foreign matter and defects on semiconductor reticle pattern
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.