U.S. federal trademark · Serial No. 78016703 · Reg. No. 2195294
Calibration of semiconductor device testing and measurement equipment; recovery of computer data on design, manufacture and testing of semiconductor devices; design and compilation of computer databases in the field of design, manufacture and testing of semiconductor devices; computer time-sharing services, computer consultation pertaining to inputting and processing data on semiconductor device design, manufacture and testing; computer consultation pertaining to operation of computer hardware used for semiconductor device testing; computer programming for others in the field of semiconductor device design, manufacturing and testing; design, maintenance and updating of computer software for operation of semiconductor device testers; computer systems analysis, construction drafting, engineering, engineering drawing, industrial design, quality control and technical research in the field of semiconductor device design, manufacturing and testing; testing semiconductor devices for others
COMPUTER OPERATING PROGRAMS FOR TESTING SEMICONDUCTOR DEVICES; COMPUTER PROGRAMS FOR OPERATING COMPUTER MONITORS; COMPUTER SOFTWARE FOR DESIGN, MANUFACTURE AND TESTING OF SEMICONDUCTOR DEVICES; ELECTRIC INSTALLATIONS, NAMELY, COMPUTER TERMINALS, FOR THE REMOTE CONTROL OF TESTERS FOR TESTING SEMICONDUCTOR DEVICES; INTEGRATED CIRCUITS, MODULES, AND OTHER SEMICONDUCTOR DEVICES, NAMELY, COMPUTER CHIPS, INTEGRATED CIRCUIT CARDS AND SILICONE WAFERS; INTERCOMMUNICATION APPARATUS, NAMELY, TRANSMITTING ELECTRONIC DEVICES, COMMUNICATION LINES, AND RECEIVING ELECTRONIC DEVICES, NAMELY RADIO, CABLE AND FIBER-OPTIC TRANSMITTERS AND RECEIVERS; COMPUTER INTERFACE BOARDS FOR MEMORY TESTERS AND COMPUTER INTERFACE BOARDS FOR COMPUTERS FOR USE IN TESTING SEMICONDUCTOR DEVICES; COMPUTER SOFTWARE FOR TRANSFORMATION OF SEMICONDUCTOR MEMORY ADDRESSES; MEASURING APPARATUS, DEVICES AND INSTRUMENTS, NAMELY, ELECTRICAL SENSORS FOR MEASURING PHYSICAL PARAMETERS OF ELECTRONIC DEVICES; COMPUTER HARDWARE FOR TESTING SEMICONDUCTOR DEVICES
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