U.S. federal trademark · Serial No. 86435331
Inspection and metrology equipment and devices, namely, instruments and devices that sense and/or capture images of semiconductor and electronic related components, primarily semiconductor wafers, semiconductor die, packaged integrated circuits, printed circuit boards, liquid crystal displays, electronic displays, and disk storage media, and automatically inspect these images for information such as defects, coordinate or position determination, identification, and/or presence or absence of a feature, characteristic or substance thereon
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.