U.S. federal trademark · Serial No. 90103469 · Reg. No. 7289139
Providing on-line non-downloadable modeling, visualization and analysis software for use in analyzing physical structures on semiconductor wafers and other substrates with nanoscale features; providing on-line non-downloadable modeling, visualization and analysis software via a global computer network for use in analyzing physical structures on semiconductor wafers and other substrates with nano-scale features
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