Downloadable computer software for three-dimensional defect detection, inspection, and image analysis in the field of semiconductor wafer and electronic component manufacturing; recorded computer software for three-dimensional defect detection, inspection, and image analysis in the field of semiconductor wafer and electronic component manufacturing

'analysi':13,36 'compon':22,45 'comput':2,25 'defect':8,31 'detect':9,32 'dimension':7,30 'download':1 'electron':21,44 'field':16,39 'imag':12,35 'inspect':10,33 'manufactur':23,46 'record':24 'semiconductor':18,41 'softwar':3,26 'three':6,29 'three-dimension':5,28 'wafer':19,42

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