U.S. federal trademark · Serial No. 79242147 · Reg. No. 5706420
[ Design, development, implementation and programming of computer software for use in analyzing thin films and thin layers; design, development, implementation and programming of computer software for use in displaying, simulating, and fitting X-ray scattering data from single crystal substrates and heteroepitaxial layers; design, development, implementation, and programming of computer software for use in characterizing thin films and thin layers; installation and repair services relating to computer software for use in analyzing thin films and thin layers; installation and repair services relating to computer software for use in displaying, simulating, and fitting X-ray scattering data from single crystal substrates and heteroepitaxial layers; installation and repair services relating to computer software for use in characterizing thin films and thin layers ]
Computer software for use in analyzing thin films and thin layers; computer software for use in displaying, simulating, and fitting X-ray scattering data from single crystal substrates and heteroepitaxial layers; computer software for use in characterizing thin films and thin layers
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