Artificial intelligence platform comprised of recorded computer software deployed to apply and develop machine learning algorithms for analysis of Big Data generated from semiconductor wafer processing, metrology, and inspection equipment and sensors to improve performance and output

'algorithm':16 'analysi':18 'appli':11 'artifici':1 'big':20 'compris':4 'comput':7 'data':21 'deploy':9 'develop':13 'equip':30 'generat':22 'improv':34 'inspect':29 'intellig':2 'learn':15 'machin':14 'metrolog':27 'output':37 'perform':35 'platform':3 'process':26 'record':6 'semiconductor':24 'sensor':32 'softwar':8 'wafer':25

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