Computer hardware, namely, computerized illumination regulators for magnifying light for use in the testing and inspection of the physical, material and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools

'analyt':70 'circuit':27,44,63 'comput':1,30,50,66 'computer':4 'control':36 'data':71 'electr':22,58 'hardwar':2 'illumin':5 'industri':49 'inspect':16,55,76 'integr':26,43,62 'light':9 'magnifi':8 'manag':39 'manufactur':48 'materi':20 'metrolog':78 'microelectron':29,47,65 'name':3 'perform':74 'physic':19,56 'process':35 'properti':23,59 'provid':69 'regul':6 'relat':46 'semiconductor':25,42,61 'softwar':31,51,67 'test':14,53 'tool':79 'use':11,33 'yield':38

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