U.S. federal trademark · Serial No. 78153811 · Reg. No. 2826491
Computer hardware and software for designing and manufacturing semiconductor wafers, masks, and reticles; metrology and inspections tools for measuring, detecting, inspecting, and sensing chemical compositions, temperature, light images, thickness, flatness, texture, line width, and contamination of semiconductor wafers, masks, and reticles during the manufacturing process
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.