U.S. federal trademark · Serial No. 79399868
Optical inspection apparatus for inspecting semiconductor materials, namely, wafers; optical inspection apparatus for inspecting photovoltaic cells, photovoltaic devices and photovoltaic modules; optical inspection apparatus for inspecting bulk silicon, silicon wafers and silicon devices; semiconductor testing apparatus for testing semiconductor materials and semiconductor devices, namely, photovoltaic devices; optical inspection apparatus for inspecting semiconductor materials and photovoltaic devices using luminescence imaging; diagnostic apparatus, for research and laboratory use for diagnosis of defects in semiconductor wafers, photovoltaic cells, photovoltaic devices and photovoltaic, not for medical purposes; downloadable software for processing images of semiconductor materials, namely, wafers; downloadable software for processing images of photovoltaic cells, photovoltaic devices and photovoltaic modules; downloadable software for automating the acquisition and analysis of photoluminescence and electroluminescence images; downloadable software for automating the analysis of photoluminescence and electroluminescence images using machine learning; downloadable software for inspecting and integrating semiconductor materials into fully automated production lines according to automated metrology and for optimization of semiconductor manufacturing lines
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