U.S. federal trademark · Serial No. 86170063 · Reg. No. 4588478
Microscopes, namely, Scanning Probe Microscopes and Atomic Force Microscopes for analyzing and manipulating surfaces at the nanometer scale by means of an atomically fine tip that scans over the surface of a sample
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.