U.S. federal trademark · Serial No. 76451084 · Reg. No. 2985779
Automatic test equipment for testing electrical properties of semiconductor integrated circuits, namely, IC testers, memory IC testers, logic testers, and circuit testers; semiconductor test system consisting primarily of a host computer and a test head having many pincards for testing semiconductor integrated circuits
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.