U.S. federal trademark · Serial No. 79450809
Machines for use in the production of electrical and electronic circuitry; robots for industrial use; robots (machines); robotic arms for industrial use; machines for assembling semiconductor components; machines for processing semiconductor wafers; equipment for processing semiconductor chips.
Measuring apparatuses; measuring tools; testing tools for electronic equipment; electrical and electronic security apparatuses and tools; electronic tracking apparatuses and tools; control electrical apparatuses; process control tools (electrical); computers; data processing apparatuses; computer recorded programs; probes for testing semiconductors; software for processing semiconductor wafers; semiconductor testing apparatuses; radio-frequency identification (RFID) readers; sensor control devices; sensors for plant control; access control boards (encoded or magnetic); electrical and electronic components; microelectronic components; integrated circuits; integrated electronic circuits; integrated electronical circuits; integrated circuit chips for electronic memories; digital electronic control devices; laboratory robots; software for robotic process automation; radiation measuring apparatuses; magnetic sensors; hardware testing software; material testing tools and machines; electronic boards.
Custom manufacturing of semiconductor components, devices, and circuits; custom assembly of electronic components.
Machinery testing; component testing; technical testing; product testing; development and testing of calculation methods, algorithms, and software; conducting industrial tests; laboratory services for analytical testing; design and development of testing and analysis methods; integrated circuit design; software design and development; firmware system design and development; technical data analysis services; electronic system design; technical services relating to electronic system design.
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.