Mechanical, electronic and optical apparatus and instruments, namely picture capturing and picture processing systems comprising computer hardware and software to control the mechanical, optical and electronic properties for use in the field of industrial non-destructive testing of materials, components and instruments for quality control of wafers and/or of solar cells during the manufacturing process

'and/or':49 'apparatus':5 'captur':10 'cell':52 'compon':41 'compris':15 'comput':16 'control':21,46 'destruct':37 'electron':2,26 'field':32 'hardwar':17 'industri':34 'instrument':7,43 'manufactur':55 'materi':40 'mechan':1,23 'name':8 'non':36 'non-destruct':35 'optic':4,24 'pictur':9,12 'process':13,56 'properti':27 'qualiti':45 'softwar':19 'solar':51 'system':14 'test':38 'use':29 'wafer':48

CRACKDTEC

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