U.S. federal trademark · Serial No. 75668943
machine vision and inspection products incorporating a two- and three-dimensional camera-based inspection method for use in inspecting various package types including "ball grid arrays," "chip scale packages," "quad flat packs" and "thin small outline packages" used in the back end semi-conductor industry
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.