Computer hardware and downloadable and prerecorded computer software all for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; electronic and scientific imaging tools for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; downloadable and prerecorded computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries

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