U.S. federal trademark · Serial No. 86386785
Consulting services in the field of product inspection and testing for the semiconductor, integrated circuit and microelectronics manufacturing industries; consulting services in the field of product inspection and testing for the semiconductor, integrated circuit and microelectronics manufacturing industries with respect to yield management; providing technical information in the field of inspection, metrology and testing of the physical and electrical properties of semiconductors, integrated circuits and microelectronics for quality control
Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools
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