Instruments and applications for the correction of wafer forms, namely, semiconductor wafer processing equipment, semiconductor wafer processing machines

'applic':3 'correct':6 'equip':14 'form':9 'instrument':1 'machin':18 'name':10 'process':13,17 'semiconductor':11,15 'wafer':8,12,16

Providing online non-downloadable computer software for inspecting wafers

'comput':6 'download':5 'inspect':9 'non':4 'non-download':3 'onlin':2 'provid':1 'softwar':7 'wafer':10

Instruments and applications for the correction of wafer forms, namely, downloadable computer software for use in processing semiconductor wafers and optical inspection apparatus for inspection of semiconductor materials in the nature of semiconductor wafers; laser systems for correcting distortion of wafers comprised of lasers for measuring and optical sensors; downloadable computer software for inspecting wafers

'apparatus':23 'applic':3 'compris':42 'comput':12,51 'correct':6,38 'distort':39 'download':11,50 'form':9 'inspect':22,25,54 'instrument':1 'laser':35,44 'materi':28 'measur':46 'name':10 'natur':31 'optic':21,48 'process':17 'semiconductor':18,27,33 'sensor':49 'softwar':13,52 'system':36 'use':15 'wafer':8,19,34,41,55

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