U.S. federal trademark · Serial No. 79115754 · Reg. No. 4362815
Inspection probe-pins being probes for testing semiconductors; spring probe for semiconductor inspection in the nature of probes for testing semiconductors; integrated circuit sockets; probes for testing semiconductors; probe cards for testing semiconductors, namely, card with integrated circuits for testing semiconductors; semiconductor testing apparatus, namely, circuit testers; [ probes for testing liquid crystal displays; probe cards for testing liquid crystal displays, namely, card with integrated circuits for testing liquid crystal displays; liquid crystal displays testing apparatus, namely, circuit testers; electrical connectors; power connectors for flexible circuit boards; cable connectors for flat cables; electrical connectors for print-circuit boards; flexible printed circuit boards; printed circuit boards; telecommunication cables; electric junction boxes for photovoltaic power generation; electric cables for photovoltaic power generation; electric cable connectors for photovoltaic power generation; electric inverters for photovoltaic power generation] * all of the above excluding software and hardware for electronic design automation and for designing and manufacturing printed circuit boards *
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.