U.S. federal trademark · Serial No. 77147737
Rental and leasing of instruments for analyzing and testing semiconductor wafer; Testing, evaluation, and research of instruments for analyzing and testing semiconductor wafers
Manufacture of electronic instruments for testing and analyzing semiconductor wafers, integrated circuits, and other electronic circuits
Electronic measuring instruments for testing and analyzing semiconductor wafers
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.