Capital equipment for the semiconductor manufacturing industry, namely, equipment for performing inspection, test and debug of circuits by measuring performance characteristics of semiconductor circuits upon the injection of electrons into the semiconductor circuits and the contact nano-probing of transistors and circuitry, for use in the design and manufacturing of semiconductor integrated circuits

'capit':1 'characterist':21 'circuit':17,24,33,54 'circuitri':43 'contact':36 'debug':15 'design':48 'electron':29 'equip':2,9 'industri':7 'inject':27 'inspect':12 'integr':53 'manufactur':6,50 'measur':19 'name':8 'nano':38 'nano-prob':37 'perform':11,20 'probe':39 'semiconductor':5,23,32,52 'test':13 'transistor':41 'upon':25 'use':45

EBIRCH

Owners

Goods & Services