U.S. federal trademark · Serial No. 98832601
Optical defect inspection equipment in the nature of electron microscopes and electron beam apparatuses used for inspecting and analyzing electronic circuits integrated in or on substrates made of glass, semiconductors, or other dielectric materials
Machines for use in the manufacture of electrical and electronic circuitry
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.