U.S. federal trademark · Serial No. 99590134
Wireless wafers being sensors for measuring physical conditions in the nature of temperature, pressure, vibration, humidity, gas concentration, and electromagnetic properties within semiconductor processing equipment or environments where wafer-like objects are spun, carried, chucked, or handled by the semiconductor processing equipment; Electronic sensors embedded in wafer-like substrates for monitoring operational parameters of semiconductor processing tools, namely, thermal temperature, mechanical, and environmental conditions; silicon data acquisition wafers featuring wireless communication modules for transmitting measurement data from semiconductor processing environments to external monitoring systems
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.