Optical monitoring, measurement and inspection equipment for measuring dimensional and/or material properties of samples, namely, for analyzing and inspecting patterned structures and films in the field of semiconductor manufacturing, and systems comprised of hardware and recorded software for process control of semiconductors manufacturing, and recorded computer operating programs for use therewith

'analyz':17 'and/or':10 'compris':32 'comput':46 'control':40 'dimension':9 'equip':6 'field':26 'film':23 'hardwar':34 'inspect':5,19 'manufactur':29,43 'materi':11 'measur':3,8 'monitor':2 'name':15 'oper':47 'optic':1 'pattern':20 'process':39 'program':48 'properti':12 'record':36,45 'sampl':14 'semiconductor':28,42 'softwar':37 'structur':21 'system':31 'therewith':51 'use':50

ELIPSON

Owners

Goods & Services