Measuring, detecting, monitoring and controlling devices and software, in particular for measuring, detecting, monitoring or controlling an electron beam; Electron backscatter-based scanning apparatus; Scanning electron microscopes; Computer software for operating and visualizing manufacturing processes; Software and apparatus for electron backscatter-based surface scanning, recording and processing scans; Software for generating images or three-dimensional models, in particular from surface scan data.

'apparatus':25,39 'backscatt':22,43 'backscatter-bas':21,42 'base':23,44 'beam':19 'comput':29 'control':5,16 'data':65 'detect':2,13 'devic':6 'dimension':58 'electron':18,20,27,41 'generat':53 'imag':54 'manufactur':35 'measur':1,12 'microscop':28 'model':59 'monitor':3,14 'oper':32 'particular':10,61 'process':36,49 'record':47 'scan':24,26,46,50,64 'softwar':8,30,37,51 'surfac':45,63 'three':57 'three-dimension':56 'visual':34

ELO

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Goods & Services