U.S. federal trademark · Serial No. 78648335
DESIGN AND TESTING FOR OTHERS OF INTEGRATED CIRCUITS AND SEMICONDUCTOR CHIPS EMBEDDED WITH NON-VOLATILE MEMORY; TESTING AND ANALYSIS OF INTEGRATED CIRCUITS FOR THE PURPOSE OF CERTIFICATION; SEMICONDUCTOR INTEGRATED CIRCUIT DESIGN AND CONSULTATION; AND TECHNICAL CONSULTATION IN THE FIELDS OF INTEGRATED CIRCUITS EMBEDDED WITH NON-VOLATILE MEMORY, AND DEVELOPMENT OF NON-VOLATILE MEMORY TECHNOLOGIES FOR DATA TRANSFORMATION AND FABRICATING PROCEDURES WITH RESPECT TO INTEGRATED CIRCUITS FOR FIRMWARE CODE STORAGE, CONFIGURATION SETTING AND TUNING
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