Capital equipment for the semiconductor manufacturing industry, namely, inspection and test apparatus, namely, Integrated Circuit (IC) design verification, debug, and failure analysis systems; automated test equipment (ATE); backside device imaging; photon timing systems; temperature mapping systems; and emission detection systems, all for measuring the performance characteristics of semiconductors

'analysi':22 'apparatus':12 'ate':27 'autom':24 'backsid':28 'capit':1 'characterist':46 'circuit':15 'debug':19 'design':17 'detect':39 'devic':29 'emiss':38 'equip':2,26 'failur':21 'ic':16 'imag':30 'industri':7 'inspect':9 'integr':14 'manufactur':6 'map':35 'measur':43 'name':8,13 'perform':45 'photon':31 'semiconductor':5,48 'system':23,33,36,40 'temperatur':34 'test':11,25 'time':32 'verif':18

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