U.S. federal trademark · Serial No. 76266525
DESIGN AND TESTING OF INTEGRATED CIRCUITS FOR OTHERS; TESTING AND ANALYSIS OF INTEGRATED CIRCUITS FOR THE PURPOSE OF CERTIFICATION; DESIGN AND TESTING OF SEMICONDUCTOR CHIPS AND INTEGRATED CIRCUITS FOR OTHERS; SEMICONDUCTOR INTEGRATED CIRCUIT DESIGN AND CONSULTATION; INTEGRATED CIRCUIT DESIGN CONSULTATION; TECHNICAL CONSULTATION IN THE FIELDS OF INTEGRATED CIRCUIT DESIGN, AND DATA TRANSFORMATION AND FABRICATING PROCEDURES WITH RESPECT TO INTEGRATED CIRCUITS
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