U.S. federal trademark · Serial No. 98408480
Probe stations for testing and inspection of semiconductor wafers and semiconductors; testing apparatus for inspecting and testing semiconductor wafers; electrical and optical inspection apparatus for inspection of semiconductor wafers; electric apparatus and instruments for the examination of semiconductor wafers, namely, semiconductor wafer probe station apparatus and instruments
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.