Providing temporary use of a web-based software application for use in semiconductor measurement and semiconductor inspections

'applic':10 'base':8 'inspect':18 'measur':15 'provid':1 'semiconductor':14,17 'softwar':9 'temporari':2 'use':3,12 'web':7 'web-bas':6

Downloadable computer application software for use in semiconductor measurement and semiconductor inspections; Electro-optical instruments for use in inspection and measurement of industrial components, namely semiconductor devices; Optical inspection instruments for inspection of semiconductor materials, namely, semiconductor wafers, reticles, and photomasks

'applic':3 'compon':25 'comput':2 'devic':28 'download':1 'electro':14 'electro-opt':13 'industri':24 'inspect':12,20,30,33 'instrument':16,31 'materi':36 'measur':9,22 'name':26,37 'optic':15,29 'photomask':42 'reticl':40 'semiconductor':8,11,27,35,38 'softwar':4 'use':6,18 'wafer':39

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