U.S. federal trademark · Serial No. 88222866 · Reg. No. 5888865
high brightness, submicron ion and electron beam columns using field emission technology, namely, focused ion beam columns for ion lithography, ion beam milling, secondary ion mass spectroscopy and mask repair; focused electron beam columns for electron beam lithography, electron beam microscopy, and liquid metal ion sources
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.