Trademark Search  /  EXTREME METROLOGY AT THE NANO-SCALE

EXTREME METROLOGY AT THE NANO-SCALE

○ Dead · Cancelled

U.S. federal trademark · Serial No. 78678046 · Reg. No. 3125190

Mark
EXTREME METROLOGY AT THE NANO-SCALE
Status
Cancelled
Serial Number
78678046
Registration No.
3125190
Filing Date
July 26, 2005
Registration Date
August 1, 2006
Class(es)
Class 042

Owners

CAMECA INSTRUMENTS, INC.
03 · MAHWAH, NJ, US
Imago Scientific Instruments Corporation
03 · Madison, WI, US
Imago Scientific Instruments Corporation
03 · Madison, WI, US

Goods & Services

Atomic, molecular, chemical, and structural analyses of materials for others; technical support, analysis, testing, consultation, and design services for scientific, electrical, optical, measuring, laboratory and test apparatus and instruments, and computer hardware and software used in connection therewith; scientific and technological research and development services for others in the fields of scientific, electrical, optical, measuring, laboratory, and test apparatus and instruments, and computer and hardware software used in connection therewith; technical support services, namely, monitoring and troubleshooting of scientific, electrical, optical, measuring, laboratory, and test apparatus and instruments, and computer hardware and software used in connection therewith

Thinking of using a similar name?
Search 14 million+ trademarks free and see if your brand conflicts with "EXTREME METROLOGY AT THE NANO-SCALE" or anything like it, before you file.
Run a free trademark search →

Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.