U.S. federal trademark · Serial No. 78138273
Computer software, namely, a real-time semiconductor fabric-wide wafer tool software package for advanced process fault detection used to monitor information from tooling on the manufacturing line.; Computer software, namely, a real-time semiconductor fabric-wide wafer tool software package for advanced process fault detection used to monitor information from tooling on the manufacturing line.
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.