Optical thin-film measuring instruments, namely, systems comprised of computers, spectrometers, lamps, fiber optic cables and lenses, sold as a unit, for measuring the thickness, deposition rate, and/or refractive index of dielectric, semiconductor, and metal thin-films

'and/or':29 'cabl':16 'compris':9 'comput':11 'deposit':27 'dielectr':33 'fiber':14 'film':4,39 'index':31 'instrument':6 'lamp':13 'lens':18 'measur':5,24 'metal':36 'name':7 'optic':1,15 'rate':28 'refract':30 'semiconductor':34 'sold':19 'spectromet':12 'system':8 'thick':26 'thin':3,38 'thin-film':2,37 'unit':22

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