An optical metrology inspection system comprised of a light source, one or more cameras and sensors in communication with computer software and hardware; Electro-optical instruments for use in inspection and measurement of industrial components; Optical inspection apparatus; Optical inspection apparatus for industrial use; Optical inspection apparatus for inspection of semiconductor materials, namely, semiconductor wafers, reticles, and photomasks

'apparatus':39,42,48 'camera':14 'communic':18 'compon':36 'compris':6 'comput':20 'electro':25 'electro-opt':24 'hardwar':23 'industri':35,44 'inspect':4,31,38,41,47,50 'instrument':27 'light':9 'materi':53 'measur':33 'metrolog':3 'name':54 'one':11 'optic':2,26,37,40,46 'photomask':59 'reticl':57 'semiconductor':52,55 'sensor':16 'softwar':21 'sourc':10 'system':5 'use':29,45 'wafer':56

FLASHQE

Owners

Goods & Services