manuals, booklets, and drawings all in the fields of automatic test equipment and semiconductor industries

'automat':10 'booklet':2 'draw':4 'equip':12 'field':8 'industri':15 'manual':1 'semiconductor':14 'test':11

temporary die carriers for integrated circuit chips and wafer level probe cards used for testing semiconductor die prior to assembly and instruction manuals sold together as a unit

'assembl':20 'card':12 'carrier':3 'chip':7 'circuit':6 'die':2,17 'instruct':22 'integr':5 'level':10 'manual':23 'prior':18 'probe':11 'semiconductor':16 'sold':24 'temporari':1 'test':15 'togeth':25 'unit':28 'use':13 'wafer':9

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