U.S. federal trademark · Serial No. 99204250
Imaging metrology tools, namely, scientific and electronic imaging instruments in the nature of optical inspection instruments, such as digital holographic microscopes, optical microscopic imagers, and interferometers, for inspecting and characterizing physical properties, including micro-bump arrays, of semiconductors, integrated circuits, and microelectronics, and their packaging; Computer hardware and recorded computer software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, and microelectronics; Optical inspection apparatus for inspection of semiconductor materials, namely, semiconductor wafers, semiconductor display panels, and their packaging; Electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers, semiconductor display panels, and their packaging
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