U.S. federal trademark · Serial No. 79294721
Semiconductor chips; wafers for integrated circuits; detectors; radar apparatus
Custom assembling of materials for others; planing of materials; laminating; material treatment information; electroplating; refining services; optical glass grinding; decontamination of hazardous materials; burnishing by abrasion; millworking
Calibration [measuring]; material testing; chemical analysis
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.