RF test probes and components, namely, balanced odd mode 100ohm probes that are convertible to 50 ohm time domain reflection probes, micro manipulator adaptors, macro-lens, SMA wrench containing probe pitch setting calibration holes, hand-held probe sleeve adapters, and cable routing sleeve, for use in measuring impedance through a circuit, discontinuities that cause reflections and the distance of the discontinuities

'100ohm':10 '50':16 'adapt':41 'adaptor':24 'balanc':7 'cabl':43 'calibr':34 'caus':56 'circuit':53 'compon':5 'contain':30 'convert':14 'discontinu':54,63 'distanc':60 'domain':19 'hand':37 'hand-held':36 'held':38 'hole':35 'imped':50 'len':27 'macro':26 'macro-len':25 'manipul':23 'measur':49 'micro':22 'mode':9 'name':6 'odd':8 'ohm':17 'pitch':32 'probe':3,11,21,31,39 'reflect':20,57 'rf':1 'rout':44 'set':33 'sleev':40,45 'sma':28 'test':2 'time':18 'use':47 'wrench':29

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