Electronic systems comprising data acquisition and analysis computer programs and software, electromagnetic and dielectrometer sensors and probes, and computer hardware and measurement systems, namely, impedance instrumentation, eddy current testing equipment, dynamic stress and/or temperature measurement equipment, calibration equipment, and materials testing equipment; all of the foregoing used for process control, quality control and field inservice inspection, and for the measurement of residual stress, of geometric properties, such as layer or coating thickness, and of electrical properties, such as conductivity and permeability, and for monitoring of age-related degeneration

'acquisit':5 'age':87 'age-rel':86 'analysi':7 'and/or':33 'calibr':37 'coat':71 'compris':3 'comput':8,19 'conduct':79 'control':50,52 'current':28 'data':4 'degener':89 'dielectromet':14 'dynam':31 'eddi':27 'electr':75 'electromagnet':12 'electron':1 'equip':30,36,38,42 'field':54 'forego':46 'geometr':65 'hardwar':20 'imped':25 'inservic':55 'inspect':56 'instrument':26 'layer':69 'materi':40 'measur':22,35,60 'monitor':84 'name':24 'permeabl':81 'probe':17 'process':49 'program':9 'properti':66,76 'qualiti':51 'relat':88 'residu':62 'sensor':15 'softwar':11 'stress':32,63 'system':2,23 'temperatur':34 'test':29,41 'thick':72 'use':47

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