high acceleration stress tester for use in the rapid degradation of inner circuits of semi-conductor chips, transistors (FET), condensers, (tantalum and polyester films), resisitances (metal films and solid), IC sockets, printed circuit boards

'acceler':2 'board':35 'chip':18 'circuit':13,34 'condens':21 'conductor':17 'degrad':10 'fet':20 'film':25,28 'high':1 'ic':31 'inner':12 'metal':27 'polyest':24 'print':33 'rapid':9 'resisit':26 'semi':16 'semi-conductor':15 'socket':32 'solid':30 'stress':3 'tantalum':22 'tester':4 'transistor':19 'use':6

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