U.S. federal trademark · Serial No. 85538153 · Reg. No. 5499848
Computer programs for use in the operation of Scanning Electron Microscopes (SEM) in the field of SEM metrology; computer programs for the manipulation, analysis, storage and management of SEM data and images; computer software platform for the management and integration of SEM (Scanning Electron Microscope) metrology applications software; data and image storage software; database management software; networking software for administration of computer networks
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