U.S. federal trademark · Serial No. 85538141 · Reg. No. 5499846
Computer programs for use in the operation of Scanning Electron Microscopes (SEM) in the field of SEM metrology; computer programs for the manipulation, analysis, storage and management of SEM data and images; computer software platform for the management and integration of SEM (Scanning Electron Microscope) metrology applications software; data and image storage software; database management software; networking software for administration of computer networks
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.