U.S. federal trademark · Serial No. 77723963 · Reg. No. 3805564
Focused ion beam instruments for ion imaging, for material removal and for material deposition; Ion sources for focused ion beam instruments, ion beam lithography instruments, and secondary ion mass spectroscopy instruments; Ion sources for ion implantation instruments, particle accelerators and ion beam etching instruments
Ion beam processing and analysis services, namely, focused ion beam microscopy in the fields of semiconductor manufacture, data storage equipment manufacture, scientific research, biological and geological sciences
Source: USPTO federal trademark records. Informational only, not legal advice. Status and details may lag the live USPTO database.