Electrical contacting devices and elements for the contacting and testing of electrical test items, namely, spring contact probes, electrical test sockets for testing semiconductor devices, electrical connector assemblies used for the testing and interconnection of electronic devices; electric connectors, and electro-mechanical interconnects

'assembl':28 'connector':27,39 'contact':2,8,17 'devic':3,25,37 'electr':1,12,19,26,38 'electro':42 'electro-mechan':41 'electron':36 'element':5 'interconnect':34,44 'item':14 'mechan':43 'name':15 'probe':18 'semiconductor':24 'socket':21 'spring':16 'test':10,13,20,23,32 'use':29

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