U.S. federal trademark · Serial No. 75562986 · Reg. No. 2176338
X-RAY MICROANALYSIS SYSTEMS, CONSISTING OF INSTRUMENTS FOR DETECTING, MEASURING AND EVALUATING X-RAYS, ELECTRON IMAGES AND SIGNALS EMITTED AND PROJECTED BY SAMPLES WHEN STRUCK BY THE BEAM OF AN ELECTRON MICROSCOPE; PARTICLE ANALYZERS; SIGNAL PROCESSORS; RADIATION ANALYZERS; LIGHT ELEMENT DETECTORS; X-RAY ANALYZERS
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